QCM as Way for Monitoring of Quasi-Monomolecular Layers of the Thin Film Formation in-situ on the Electrode Surface Resonator
Abstract
References
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Copyright (©) 2010 V.N. Grebennikov, G.M. Telbiz, L.M. Pogorelaya, P.A. Manorik, V.A. Nevinsky, A.V. Shulzhenko
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