Kosenok, Ya. A., Гомельський державний університет ім. Франциска Скоріни, Belarus
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Vol 5, No 1 (2014): Chemistry, Physics and Technology of Surface / Himia, Fizika ta Tehnologia Poverhni - Articles
AFM and SEM study on the morphology of SiO2 nanoparticles in polishing slurries
Abstract PDF (Українська)
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